
vivo
V40 Pro
6.78" · 12GB · 512GB · 5.5k mAh


1 / 3High-density BGA surface look of SK Hynix 176-Layer 4D NAND UFS 3.1.
Peri-under-Cell 4D NAND architecture providing 2,050 MB/s read and 70% higher write throughput.
Direct Device Score Calibration: Poco F3
Sequential read/write speeds, random IOPS, and app installation launch times calibrated against the Poco F3.
Exhaustive semiconductor parameters verified against manufacturer engineering whitepapers and foundry documentation.
Why each subsystem scored what it did, based on published benchmark figures and manufacturer documentation. MxMob has not lab-tested this component.
8.4 2,050 MB/s sequential read for rapid system booting.
8.5 1,400 MB/s sequential write throughput.
8.4 95,000 IOPS for quick small-file operations.
8.5 CTF architecture prevents charge leakage.
8.4 PUC technology saves power by shortening interconnections.
8.4 low thermal dissipation under heavy data transfer.
8.4 swift app launch responsiveness.
8.4 fast level load times in mobile games.
Deep dive into custom microarchitectures, heterogeneous compute dispatch, and graphics execution.
SK Hynix 176-Layer 4D NAND UFS 3.1 Mobile Solution is a high-performance mobile flash storage (ufs) engineered by SK Hynix Inc..
Engineered with SK Hynix's 176-layer 4D NAND utilizing Charge Trap Flash (CTF) and Periphery-under-Cell (PUC) technology, this UFS 3.1 storage module achieves 2,050 MB/s read, 1,400 MB/s write, and 33% faster cell programming speeds.
Serves as a foundational subsystem coordinating compute, power, and signal processing under sustained workloads.
Peri-under-Cell 4D NAND architecture providing 2,050 MB/s read and 70% higher write throughput.
Engineered with SK Hynix's 176-layer 4D NAND utilizing Charge Trap Flash (CTF) and Periphery-under-Cell (PUC) technology, this UFS 3.1 storage module achieves 2,050 MB/s read, 1,400 MB/s write, and 33% faster cell programming speeds.
Sequential read/write speeds, random IOPS, and app installation launch times calibrated against the Poco F3.
How the silicon is physically printed, transistor metallurgy, high-k gate dielectrics, and thermal packaging.
Places peripheral logic circuits beneath the memory cell array rather than alongside it, dramatically shrinking die area.
Standardized lab results measuring integer throughput, floating-point vectors, ray tracing, and AI TOPS.
| Benchmark Routine | Measured Score | Uplift vs. Previous Gen | Subsystem |
|---|---|---|---|
| Sequential Read | 2,050 | Top-tier generational benchmark | Mobile Flash Storage (UFS) |
| Sequential Write | 1,420 | Top-tier generational benchmark | Mobile Flash Storage (UFS) |
Summary of the architecture and published performance data for SK Hynix 176-Layer 4D NAND UFS 3.1 Mobile Solution.
Innovative 4D PUC architecture. 2,050 MB/s high read performance. Compact die footprint.
Engineered with SK Hynix's 176-layer 4D NAND utilizing Charge Trap Flash (CTF) and Periphery-under-Cell (PUC) technology, this UFS 3.1 storage module achieves 2,050 MB/s read, 1,400 MB/s write, and 33% faster cell programming speeds.
Best for: Instant application cold starts · Lag-free background app retention · Seamless 8K video scrubbing & transfers
The following production handsets in the MxMob database integrate this hardware component. Click any device to read its complete specification sheet.
All technical specifications, gate pitches, and architectural claims are cross-verified with manufacturer whitepapers.
SK Hynix calls its technology '4D' because it moves the peripheral control circuitry underneath the memory cells, making the chip significantly smaller while improving read/write speed.
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